9 results
Spectroscopic study of interfaces in Al/Ni periodic multilayers
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- Journal:
- The European Physical Journal - Applied Physics / Volume 45 / Issue 2 / February 2009
- Published online by Cambridge University Press:
- 31 January 2009, 20502
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- February 2009
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Use of Multilayer Gratings to Improve the X-ray Spectral Analysis at Low Photon Energy
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 162-163
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- August 2007
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Characterization of AlMg Alloys from their Electronic Structure
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1416-1417
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- August 2007
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MONOX: a characterization tool for the X-UV range
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- Journal:
- The European Physical Journal - Applied Physics / Volume 31 / Issue 2 / August 2005
- Published online by Cambridge University Press:
- 18 August 2005, pp. 147-152
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- August 2005
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Quantitative Study of the Transition Layers in Mo/Si; Multilayers from the Analysis of the Si KΒ X–ray Emission Band
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 472-473
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- August 2005
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The X-ray Analysis at High Spectral Resolution
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- Journal:
- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 1274-1275
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- August 2005
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Depth profiling of P shallow implants in silicon by electron-induced X-ray emission spectroscopy
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- Journal:
- The European Physical Journal - Applied Physics / Volume 24 / Issue 2 / November 2003
- Published online by Cambridge University Press:
- 20 October 2003, pp. 115-119
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- November 2003
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Physico-chemical environment of Al impurity atoms in amorphous silica
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- Journal:
- The European Physical Journal - Applied Physics / Volume 21 / Issue 2 / February 2003
- Published online by Cambridge University Press:
- 29 November 2002, pp. 147-149
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- February 2003
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X-ray emission induced by low energy electrons
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- Journal:
- Microscopy and Microanalysis / Volume 8 / Issue S02 / August 2002
- Published online by Cambridge University Press:
- 01 August 2002, pp. 436-437
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- August 2002
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